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Deutsches Institut Fur Normung E.V. (German National Standard), 12/01/1977
Publisher: DIN
File Format: PDF
$17.00$35.30
Published:01/12/1977
Pages:6
File Size:1 file , 460 KB
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Testing of materials for semiconductor technology; determination of the dopant concentration profile of single crystalline semiconductor material by means of the capacitancevoltage method and mercury contact
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