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Deutsches Institut Fur Normung E.V. (German National Standard), 08/01/2001
Publisher: DIN
File Format: PDF
$17.00$35.30
Published:01/08/2001
Pages:3
File Size:1 file , 110 KB
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Testing of materials for semiconductor technology; determination of the orientation of single crystals by means of Laue back scattering
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Hexagon thin slotted nuts with small widths across flats for use in automotive engineering (not intended for new designs)
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Thermal analysis (TA) - Terms
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Nickel-cadmium-batteries; cells with fibre structured plates; cells in plastic containers; nominal capacities, main dimensions
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