DIN 50439

Testing of materials for semiconductor technology; determination of the dopant concentration profile of single crystalline semiconductor material by means of the capacitancevoltage method and mercury contact

Deutsches Institut Fur Normung E.V. (German National Standard), 10/01/1982

Publisher: DIN

File Format: PDF

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Description

Published:01/10/1982

Pages:6

File Size:1 file

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