• DIN 50455-1 - DRAFT

DIN 50455-1 - DRAFT

Draft Document - Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods

Deutsches Institut Fur Normung E.V. (German National Standard), 04/01/2008

Publisher: DIN

File Format: PDF

$21.00$42.93


Published:01/04/2008

Pages:8

File Size:1 file

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