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International Electrotechnical Commission, 01/01/1982
Publisher: IEC
File Format: PDF
$25.00$51.00
Published:01/01/1982
Pages:19
File Size:1 file , 750 KB
Note:This product is unavailable in Ukraine, Russia, Belarus
Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
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Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 712: Antennas
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Amendment 3 - International Electrotechnical Vocabulary (IEV) - Part 815: Superconductivity
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