IEC 60191-4 Ed. 3.1 b:2018

Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages CONSOLIDATED EDITION

International Electrotechnical Commission, 03/27/2018

Publisher: IEC

File Format: PDF

$186.00$373.00


Published:27/03/2018

Pages:152

File Size:1 file , 2.3 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60191-4:2013+A1:2018 specifies a method for the designation of package outlines and for the classification of forms of package outlines for semiconductor devices and a systematic method for generating universal descriptive designators for semiconductor device packages. The descriptive designator provides a useful communication tool but has no implied control for assuring package interchangeability. This edition includes the following significant technical changes with respect to the previous edition:
a) Material code "S" is added to indicate a silicon based package.
b) Description of "WL" is added to be used for general use. This consolidated version consists of the third edition (2013) and its amendment 1 (2018). Therefore, no need to order amendment in addition to this publication.

More IEC standard pdf

IEC 60749-22 Ed. 1.0 b:2002

IEC 60749-22 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength

$95.00 $190.00

IEC 60749-8 Ed. 1.0 b:2002

IEC 60749-8 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

$47.00 $95.00

IEC 60068-2-9 Amd.1 Ed. 1.0 b CORR1:1989

IEC 60068-2-9 Amd.1 Ed. 1.0 b CORR1:1989

Corrigendum 1 to Amendment 1 - Environmental testing - Part 2: Tests. Guidance for solar radiation testing

$114.00 $228.21

IEC 60749-31 Ed. 1.0 b:2002

IEC 60749-31 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

$12.00 $25.00