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International Electrotechnical Commission, 07/11/2007
Publisher: IEC
File Format: PDF
$13.00$27.00
Published:11/07/2007
Pages:4
File Size:1 file , 160 KB
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Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
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Environmental testing - Part 2-38: Tests - Test Z/AD: Composite temperature/humidity cyclic test
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Scales and sizes for plotting frequency characteristics and polar diagrams
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Materials for printed boards and other interconnecting structures - Part 2-34: Reinforced base materials, clad and unclad - Non-halogenated modified or unmodified resin system, woven E-glass laminate sheets of defined relative permittivity (equal to or less than 3,7 at 1 GHz) and flammability (verti
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