• Your shopping cart is empty!

PDF Preview

IEC 60444-2 Ed. 1.0 b:1980

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

International Electrotechnical Commission, 01/01/1980

Publisher: IEC

File Format: PDF

$25.00$51.00


Published:01/01/1980

Pages:18

File Size:1 file , 540 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

More IEC standard pdf

IEC 61158-6-18 Ed. 2.0 b:2010

IEC 61158-6-18 Ed. 2.0 b:2010

Industrial communication networks - Fieldbus specifications - Part 6-18: Application layer protocol specification - Type 18 elements

$183.00 $367.00

IEC 61158-5-14 Ed. 2.0 en:2010

IEC 61158-5-14 Ed. 2.0 en:2010

Industrial communication networks - Fieldbus specifications - Part 5-14: Application layer service definition - Type 14 elements

$147.00 $295.00

IEC 61158-4-19 Ed. 2.0 en:2010

IEC 61158-4-19 Ed. 2.0 en:2010

Industrial communication networks - Fieldbus specifications - Part 4-19: Data-link layer protocol specification - Type 19 elements

$193.00 $387.00

IEC 60834-2 Ed. 1.0 b:1993

IEC 60834-2 Ed. 1.0 b:1993

Performance and testing of teleprotection equipment of power systems - Part 2: Analogue comparison systems

$139.00 $278.00