IEC 60444-8 Ed. 1.0 b:2003

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

International Electrotechnical Commission, 07/04/2003

Publisher: IEC

File Format: PDF

$27.00$55.00


Published:04/07/2003

Pages:21

File Size:1 file , 590 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units over the frequency range from 1 MHz to 150 MHz using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.

More IEC standard pdf

IEC 60721-3-1 Ed. 3.0 b:2018

IEC 60721-3-1 Ed. 3.0 b:2018

Classification of environmental conditions - Part 3-1: Classification of groups of environmental parameters and their severities - Storage

$47.00 $95.00

IEC 62271-101 Amd.1 Ed. 2.0 b:2017

IEC 62271-101 Amd.1 Ed. 2.0 b:2017

Amendment 1 - High-voltage switchgear and controlgear - Part 101: Synthetic testing

$196.00 $392.00

IEC 60721-3-2 Ed. 3.0 b:2018

IEC 60721-3-2 Ed. 3.0 b:2018

Classification of environmental conditions - Part 3-2: Classification of groups of environmental parameters and their severities - Transportation and Handling

$47.00 $95.00

IEC 61300-3-47 Ed. 1.0 b:2014

IEC 61300-3-47 Ed. 1.0 b:2014

Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-47: Examinations and measurements - End face geometry of PC/APC spherically polished ferrules using interferometry

$72.00 $145.00