IEC 60444-8 Ed. 1.0 b:2003

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

International Electrotechnical Commission, 07/04/2003

Publisher: IEC

File Format: PDF

$27.00$55.00


Published:04/07/2003

Pages:21

File Size:1 file , 590 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units over the frequency range from 1 MHz to 150 MHz using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.

More IEC standard pdf

IEC 61315 Ed. 1.0 b:1995

IEC 61315 Ed. 1.0 b:1995

Calibration of fibre optic power meters

$81.00 $163.00

IEC 60136 Amd.1 Ed. 2.0 b:1995

IEC 60136 Amd.1 Ed. 2.0 b:1995

Amendment 1 - Dimensions of brushes and brush-holders for electrical machinery

$6.00 $13.00

IEC 60747-8-3 Ed. 1.0 b:1995

IEC 60747-8-3 Ed. 1.0 b:1995

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors - Section 3: Blank detail specification for case-rated field effect transistors for switching applications

$60.00 $121.00

IEC 60825-1 Ed. 2.0 b:2007

IEC 60825-1 Ed. 2.0 b:2007

Safety of laser products - Part 1: Equipment classification and requirements

$181.00 $363.00