IEC 60512-16-1 Ed. 1.0 b:2008

Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage

International Electrotechnical Commission, 06/11/2008

Publisher: IEC

File Format: PDF

$12.00$25.00


Published:11/06/2008

Pages:12

File Size:1 file , 830 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60512-16-1:2008 details a standard test method to assess the effectiveness of the elastic system of contacts to resist damage from the insertion of a specified test probe.

More IEC standard pdf

IEC 60512-5 Ed. 2.0 b:1992

IEC 60512-5 Ed. 2.0 b:1992

Electromechanical components for electronic equipment; basic testing procedures and measuring methods - Part 5: Impact tests (free components), static load tests (fixed components), endurance tests and overload tests

$64.00 $128.00

IEC 60510-2-5 Ed. 1.0 b:1992

IEC 60510-2-5 Ed. 1.0 b:1992

Methods of measurement for radio equipment used in satellite earth stations - Part 2: Measurements for sub-systems - Section five: Frequency modulators

$47.00 $95.00

IEC 60191-5 Ed. 2.0 b:1997

IEC 60191-5 Ed. 2.0 b:1997

Mechanical standardization of semiconductor devices - Part 5: Recommendations applying to integrated circuit packages using tape automated bonding (TAB)

$139.00 $278.00

IEC 60603-7-7 Ed. 3.0 b:2010

IEC 60603-7-7 Ed. 3.0 b:2010

Connectors for electronic equipment - Part 7-7: Detail specification for 8-way, shielded, free and fixed connectors for data transmission with frequencies up to 600 MHz

$117.00 $234.00