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International Electrotechnical Commission, 12/22/1999
Publisher: IEC
File Format: PDF
$89.00$179.00
Published:22/12/1999
Pages:45
File Size:1 file , 340 KB
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Standard test procedures for semiconductor X-ray energy spectrometers
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International Electrotechnical Vocabulary (IEV) - Part 431: Transductors
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Methods of test for volume resistivity and surface resistivity of solid electrical insulating materials
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Amendment 1 - Dimensions of clevis and tongue couplings of string insulator units
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