Your shopping cart is empty!
PDF Preview
International Electrotechnical Commission, 06/20/2001
Publisher: IEC
File Format: PDF
$85.00$171.00
Published:20/06/2001
Pages:69
File Size:1 file , 490 KB
Note:This product is unavailable in Ukraine, Russia, Belarus
Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-54: Tests - Corrosive atmosphere (mixed gas)
$25.00 $51.00
Nuclear power plants - Instrumentation, control and electrical power systems - Cybersecurity requirements
$183.00 $367.00
Specifications for particular types of winding wires - Part 0-1: General requirements - Enamelled round copper wire CONSOLIDATED EDITION
$186.00 $373.00
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
$95.00 $190.00