IEC 60747-14-11 Ed. 1.0 en:2021

Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

International Electrotechnical Commission, 03/03/2021

Publisher: IEC

File Format: PDF

$95.00$190.00


Published:03/03/2021

Pages:21

File Size:1 file , 2.1 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60747-14-11:2021(E) defines the terms, definitions, configuration, and test methods can be used to evaluate and determine the performance characteristics of surface acoustic wave-based semiconductor sensors integrated with ultraviolet, illuminance, and temperature sensors. The measurement methods are for DC characteristics and RF characteristics, and the measurement method for RF characteristics includes a direct mode and differential amplifier mode based on feedback oscillation. This document excludes devices dealt with by TC 49: piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection.

More IEC standard pdf

IEC 60588-2 Ed. 1.0 b:1978

IEC 60588-2 Ed. 1.0 b:1978

Askarels for transformers and capacitors. Part 2: Test methods

$95.00 $190.00

IEC 60068-3-1A Ed. 1.0 b:1978

IEC 60068-3-1A Ed. 1.0 b:1978

Environmental testing - Part 3: Background information - First supplement

$12.00 $25.00

IEC 60581-3 Ed. 1.0 b:1978

IEC 60581-3 Ed. 1.0 b:1978

High fidelity audio equipment and systems: Minimum performance requirements. Part 3: Record playing equipment and cartridges

$12.00 $25.00

IEC 60574-1 Ed. 1.0 b:1977

IEC 60574-1 Ed. 1.0 b:1977

Audiovisual, video and television equipment and systems. Part 1: General

$16.00 $32.00