IEC 60748-11-1 Ed. 1.0 b:1992

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

International Electrotechnical Commission, 04/01/1992

Publisher: IEC

File Format: PDF

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Description

Published:01/04/1992

Pages:71

File Size:1 file , 2.5 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

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