• Your shopping cart is empty!

PDF Preview

IEC 60749-1 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

International Electrotechnical Commission, 08/30/2002

Publisher: IEC

File Format: PDF

$12.00$25.00


Published:30/08/2002

Pages:15

File Size:1 file , 390 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.

More IEC standard pdf

IEC 62273-1 Ed. 1.0 b:2007

IEC 62273-1 Ed. 1.0 b:2007

Methods of measurement for radio transmitters - Part 1: Performance characteristics of terrestrial digital television transmitters

$139.00 $278.00

IEC 60335-2-43 Ed. 3.1 b:2005

IEC 60335-2-43 Ed. 3.1 b:2005

Household and similar electrical appliances - Safety - Part 2-43: Particular requirements for clothes dryers and towel rails CONSOLIDATED EDITION

$33.00 $66.00

IEC 62071-1 Ed. 1.0 en:2005

IEC 62071-1 Ed. 1.0 en:2005

Helical-scan compressed digital video cassette system using 6,35 mm magnetic tape - Format D-7 - Part 1: VTR specifications

$155.00 $310.00

IEC 62298-4 Ed. 1.0 en:2005

IEC 62298-4 Ed. 1.0 en:2005

TeleWeb application - Part 4: Hyperteletext profile

$139.00 $278.00