IEC 60749-10 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

International Electrotechnical Commission, 04/09/2002

Publisher: IEC

File Format: PDF

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Description

Published:09/04/2002

Pages:7

File Size:1 file , 400 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages.

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