IEC 60749-11 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

International Electrotechnical Commission, 04/12/2002

Publisher: IEC

File Format: PDF

$12.00$25.00


Published:12/04/2002

Pages:13

File Size:1 file , 410 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification.

More IEC standard pdf

IEC 60852-1 Ed. 1.0 b:1986

IEC 60852-1 Ed. 1.0 b:1986

Outline dimensions of transformers and inductors for use in telecommunication and electronic equipment - Part 1: Transformers and inductors using YEI-1 laminations

$25.00 $51.00

IEC 61158-3-16 Ed. 1.0 en:2007

IEC 61158-3-16 Ed. 1.0 en:2007

Industrial communication networks - Fieldbus specifications - Part 3-16: Data-link layer service definition - Type 16 elements

$84.00 $169.00

IEC 60050-321 Ed. 1.0 b:1986

IEC 60050-321 Ed. 1.0 b:1986

International Electrotechnical Vocabulary. Chapter 321: Instrument transformers

$60.00 $121.00

IEC 60747-3-1 Ed. 1.0 b:1986

IEC 60747-3-1 Ed. 1.0 b:1986

Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes - Section One: Blank detail specification for signal diodes, switching diodes and controlled-avalanche diodes

$22.00 $45.00