IEC 60749-12 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

International Electrotechnical Commission, 04/30/2002

Publisher: IEC

File Format: PDF

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Description

Published:30/04/2002

Pages:7

File Size:1 file , 380 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.

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