IEC 60749-13 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

International Electrotechnical Commission, 04/12/2002

Publisher: IEC

File Format: PDF

$11.00$23.00

Description

Published:12/04/2002

Pages:9

File Size:1 file , 400 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

More IEC standard pdf

IEC 62769-102-2 Ed. 1.0 b:2023

Field device integration (FDI®) – Part 102-2: Profiles – EtherNet/IP

$47.00 $95.00

IEC 60794-1-309 Ed. 1.0 b:2023

Optical fibre cables – Part 1-309: Generic specification – Basic optical cable test procedures – Cable element test methods – Bleeding and evaporation of filling or flooding compounds, Method G9

$12.00 $25.00

IEC 62769-5 Ed. 3.0 b:2023

Field Device Integration (FDI) - Part 5: FDI Information Model

$208.00 $417.00

IEC 60255-187-1 Ed. 1.0 b Cor.1:2023

Corrigendum 1 to Measuring relays and protection equipment – Part 187-1: Functional requirements for differential protection – Restrained and unrestrained differential protection of motors, generators and transformers

$103.00 $206.20