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IEC 60749-17 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

International Electrotechnical Commission, 02/20/2003

Publisher: IEC

File Format: PDF

$11.00$23.00


Published:20/02/2003

Pages:11

File Size:1 file , 410 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

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