• Your shopping cart is empty!

PDF Preview

IEC 60749-17 Ed. 2.0 b:2019

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

International Electrotechnical Commission, 03/28/2019

Publisher: IEC

File Format: PDF

$25.00$51.00


Published:28/03/2019

Pages:17

File Size:1 file , 1000 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

More IEC standard pdf

IEC 61326-2-4 Ed. 2.0 b:2012

IEC 61326-2-4 Ed. 2.0 b:2012

Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-4: Particular requirements - Test configurations, operational conditions and performance criteria for insulation monitoring devices according to IEC 61557-8 and for equipment for insulation fault location ac

$41.00 $82.00

IEC 60050-604 Amd.1 Ed. 1.0 b:1998

IEC 60050-604 Amd.1 Ed. 1.0 b:1998

Amendment 1 - International Electrotechnical Vocabulary. Chapter 604: Generation, transmission and distribution of electricity - Operation

$24.00 $48.00

IEC 61029-2-5 Ed. 1.0 b:1993

IEC 61029-2-5 Ed. 1.0 b:1993

Safety of transportable motor-operated electric tools - Part 2: Particular requirements for band saws

$25.00 $51.00

IEC 60601-2-45 Ed. 2.0 en:2001

IEC 60601-2-45 Ed. 2.0 en:2001

Medical electrical equipment - Part 2-45: Particular requirements for the safety of mammographic X-ray equipment and mammographic stereotactic devices

$62.00 $124.00