• Your shopping cart is empty!

PDF Preview

IEC 60749-18 Ed. 2.0 b:2019

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

International Electrotechnical Commission, 04/10/2019

Publisher: IEC

File Format: PDF

$95.00$190.00


Published:10/04/2019

Pages:44

File Size:1 file , 1.5 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60749-18 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.

More IEC standard pdf

IEC 61334-4-512 Ed. 1.0 b:2001

IEC 61334-4-512 Ed. 1.0 b:2001

Distribution automation using distribution line carrier systems - Part 4-512: Data communication protocols - System management using profile 61334-5-1 - Management Information Base (MIB)

$95.00 $190.00

IEC 62216-1 Ed. 1.0 en:2001

IEC 62216-1 Ed. 1.0 en:2001

Digital terrestrial television receivers for the DVB-T system - Part 1: Baseline receiver specification

$132.00 $265.00

IEC 60191-6-1 Ed. 1.0 en:2001

IEC 60191-6-1 Ed. 1.0 en:2001

Mechanical standardization of semiconductor devices - Part 6-1: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for gull-wing lead terminals

$12.00 $25.00

IEC 60947-4-2 Amd.1 Ed. 2.0 b CORR1:2002

IEC 60947-4-2 Amd.1 Ed. 2.0 b CORR1:2002

Corrigendum 1 to Amendment 1 - Low-voltage switchgear and controlgear - Part 4-2: Contactors and motor-starters - AC semiconductor motor controllers and starters

$121.00 $243.78