• IEC 60749-20 Ed. 1.0 b:2002

IEC 60749-20 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat

International Electrotechnical Commission, 09/30/2002

Publisher: IEC

File Format: PDF

$58.00$117.00


Published:30/09/2002

Pages:49

File Size:1 file , 1.7 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

Applies to semiconductor devices (discrete devices and integrated circuits) - and provides a means of assessing the resistance to soldering heat of plastic-encapsulated surface mount devices.

More IEC standard pdf

IEC 60852-5 Ed. 1.0 b:1994

IEC 60852-5 Ed. 1.0 b:1994

Outline dimensions of transformers and inductors for use in telecommunication and electronic equipment - Part 5: Transformers and inductors using the series Q of C-cores

$12.00 $25.00

IEC 61300-2-23 Ed. 2.0 b:2010

IEC 61300-2-23 Ed. 2.0 b:2010

Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 2-23: Tests - Sealing for non-pressurized closures of fibre optic devices

$12.00 $25.00

IEC 61947-2 Ed. 1.0 b:2001

IEC 61947-2 Ed. 1.0 b:2001

Electronic projection - Measurement and documentation of key performance criteria - Part 2: Variable resolution projectors

$164.00 $329.00

IEC 60793-1-20 Ed. 1.0 b:2001

IEC 60793-1-20 Ed. 1.0 b:2001

Optical fibres - Part 1-20: Measurement methods and test procedures - Fibre geometry

$103.00 $206.00