IEC 60749-20 Ed. 2.0 b:2008

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

International Electrotechnical Commission, 12/09/2008

Publisher: IEC

File Format: PDF

$99.00$199.00

Description

Published:09/12/2008

Pages:53

File Size:1 file , 1.5 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60749-20:2008 provides a means of assessing the resistance to soldering heat of semiconductors packaged as plastic encapsulated surface mount devices (SMDs). This test is destructive. This second edition cancels and replaces the first edition published in 2002 and constitutes a technical revision. The main changes are as follows:
- to reconcile certain classifications of IEC 60749-20 and those of IPC/JEDEC J-STD-020C;
- reference IEC 60749-35 instead of Annex A of IEC 60749-20, Edition 1;
- update for lead-free solder;
- correct certain errors in the original Edition 1.

IEC 60749-20 Ed. 2.0 b:2008

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

More IEC standard pdf

IEC 61784-5-16 Ed. 1.0 b:2013

IEC 60730-2-15 Ed. 2.0 b:2008

IEC 60317-18 Amd.1 Ed. 3.0 b:2009

IEC 60641-3-2 Ed. 2.0 b:2008