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  • IEC 60749-23 Amd.1 Ed. 1.0 b:2011

IEC 60749-23 Amd.1 Ed. 1.0 b:2011

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

International Electrotechnical Commission, 01/27/2011

Publisher: IEC

File Format: PDF

$6.00$13.00


Published:27/01/2011

Pages:5

File Size:1 file , 260 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

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