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IEC 60749-23 Ed. 1.0 b:2004

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

International Electrotechnical Commission, 02/23/2004

Publisher: IEC

File Format: PDF

$25.00$51.00


Published:23/02/2004

Pages:17

File Size:1 file , 500 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

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