IEC 60749-23 Ed. 1.0 b:2004

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

International Electrotechnical Commission, 02/23/2004

Publisher: IEC

File Format: PDF

$25.00$51.00

Description

Published:23/02/2004

Pages:17

File Size:1 file , 500 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

More IEC standard pdf

IEC 62563-1 Ed. 1.2 b:2021

Medical electrical equipment - Medical image display systems - Part 1: Evaluation methods CONSOLIDATED EDITION

$329.00 $658.00

IEC 60601-2-43 Amd.2 Ed. 2.0 b:2019

Amendment 2 - Medical electrical equipment - Part 2-43: Particular requirements for the basic safety and essential performance of X-ray equipment for interventional procedures

$66.00 $133.00

IEC 61850-7-3 Amd.1 Ed. 2.0 b:2020

Amendment 1 - Communication networks and systems for power utility automation - Part 7-3: Basic communication structure - Common data classes

$208.00 $417.00

IEC 60364-7-701 Ed. 3.0 b:2019

Low-voltage electrical installations - Part 7-701: Requirements for special installations or locations - Locations containing a bath or shower

$117.00 $234.00