IEC 60749-24 Ed. 1.0 b:2004

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

International Electrotechnical Commission, 03/09/2004

Publisher: IEC

File Format: PDF

$25.00$51.00

Description

Published:09/03/2004

Pages:19

File Size:1 file , 470 KB

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The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

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