• Your shopping cart is empty!

  • IEC 60749-24 Ed. 1.0 b:2004

IEC 60749-24 Ed. 1.0 b:2004

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

International Electrotechnical Commission, 03/09/2004

Publisher: IEC

File Format: PDF

$25.00$51.00


Published:09/03/2004

Pages:19

File Size:1 file , 470 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

More IEC standard pdf

IEC 60067E Ed. 2.0 b:1986

IEC 60067E Ed. 2.0 b:1986

Supplement E - Dimensions of electronic tubes and valves

$25.00 $51.00

IEC 60811-1-4 Ed. 1.0 b CORR1:1986

IEC 60811-1-4 Ed. 1.0 b CORR1:1986

Corrigendum 1 - Common test methods for insulating and sheathing materials of electric cables - Part 1: Methods for general application - Section Four: Tests at low temperature

$112.00 $224.64

IEC 60811-3-1 Ed. 1.0 b CORR1:1986

IEC 60811-3-1 Ed. 1.0 b CORR1:1986

Corrigendum 1 - Common test methods for insulating ans sheathing materials of electric cables - Part 3: Methods specific to PVC compounds - Section One: Pressure test at high temperature - Tests for resistance to cracking

$148.00 $296.49

IEC 60811-3-2 Ed. 1.0 b CORR1:1986

IEC 60811-3-2 Ed. 1.0 b CORR1:1986

Corrigendum 1 - Common test methods for insulating and sheathing materials of electric cables - Part 3: Methods specific to PVC compounds - Section Two: Loss of mass test - Thermal stability test

$112.00 $224.60