• Your shopping cart is empty!

PDF Preview

IEC 60749-3 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual inspection

International Electrotechnical Commission, 04/09/2002

Publisher: IEC

File Format: PDF

$6.00$12.00


Published:09/04/2002

Pages:7

File Size:1 file , 360 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Aims at verifying that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types.

More IEC standard pdf

IEC 60721-2-4 Ed. 2.0 b:2018

IEC 60721-2-4 Ed. 2.0 b:2018

Classification of environmental conditions - Part 2-4: Environmental conditions appearing in nature - Solar radiation and temperature

$47.00 $95.00

IEC 60076-3 Ed. 3.1 b:2018

IEC 60076-3 Ed. 3.1 b:2018

Power transformers - Part 3: Insulation levels, dielectric tests and external clearances in air CONSOLIDATED EDITION

$234.00 $468.00

IEC 60153-1 Ed. 2.0 b:2016

IEC 60153-1 Ed. 2.0 b:2016

Hollow metallic waveguides - Part 1: General requirements and measuring methods

$47.00 $95.00

IEC 60335-2-65 Ed. 2.2 b:2015

IEC 60335-2-65 Ed. 2.2 b:2015

Household and similar electrical appliances - Safety - Part 2-65:Particular requirements for air-cleaning appliances CONSOLIDATED EDITION

$69.00 $139.00