IEC 60749-30 Ed. 2.0 b:2020

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

International Electrotechnical Commission, 08/17/2020

Publisher: IEC

File Format: PDF

$47.00$95.00

Description

Published:17/08/2020

Pages:26

File Size:1 file , 1.1 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60749-30:2020 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation.

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