IEC 60749-31 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)

International Electrotechnical Commission, 08/30/2002

Publisher: IEC

File Format: PDF

$12.00$25.00

Description

Published:30/08/2002

Pages:9

File Size:1 file , 330 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.

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