• Your shopping cart is empty!

PDF Preview

IEC 60749-36 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

International Electrotechnical Commission, 02/13/2003

Publisher: IEC

File Format: PDF

$6.00$13.00


Published:13/02/2003

Pages:7

File Size:1 file , 210 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

More IEC standard pdf

IEC 60534-2-4 Ed. 2.0 b:2009

IEC 60534-2-4 Ed. 2.0 b:2009

Industrial-process control valves - Part 2-4: Flow capacity - Inherent flow characteristics and rangeability

$25.00 $51.00

IEC 61156-6-1 Ed. 2.0 en:2007

IEC 61156-6-1 Ed. 2.0 en:2007

Multicore and symmetrical pair/quad cables for digital communications - Part 6-1: Symmetrical pair/quad cables with transmission characteristics up to 1 000 MHz - Working area wiring - Blank detail specification

$25.00 $51.00

IEC 60286-3-2 Ed. 1.0 en:2009

IEC 60286-3-2 Ed. 1.0 en:2009

Packaging of components for automatic handling - Part 3-2: Packaging of surface mount components on continuous tapes - Type VI - Blister carrier tapes of 4 mm width

$31.00 $62.00

IEC 61158-6-2 Ed. 1.0 en:2007

IEC 61158-6-2 Ed. 1.0 en:2007

Industrial communication networks - Fieldbus specifications - Part 6-2: Application layer protocol specification - Type 2 elements

$150.00 $301.00