IEC 60749-36 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration, steady state

International Electrotechnical Commission, 02/13/2003

Publisher: IEC

File Format: PDF

$6.00$13.00


Published:13/02/2003

Pages:7

File Size:1 file , 210 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

More IEC standard pdf

IEC 61097-12 Ed. 1.0 en:1996

IEC 61097-12 Ed. 1.0 en:1996

Global maritime distress and safety system (GMDSS) - Part 12: Survival craft portable two-way VHF radiotelephone apparatus - Operational and performance requirements, methods of testing and required test results

$139.00 $278.00

IEC 62439-1 Ed. 1.0 en:2010

IEC 62439-1 Ed. 1.0 en:2010

Industrial communication networks - High availability automation networks - Part 1: General concepts and calculation methods

$146.00 $292.00

IEC 61075 Ed. 1.0 b:1991

IEC 61075 Ed. 1.0 b:1991

Loran-C receivers for ships - Minimum performance standards - Methods of testing and required test results

$77.00 $154.00

IEC 60317-18 Ed. 3.1 b:2010

IEC 60317-18 Ed. 3.1 b:2010

Specifications for particular types of winding wires - Part 18: Polyvinyl acetal enamelled rectangular copper wire, class 120 CONSOLIDATED EDITION

$38.00 $76.00