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IEC 60749-4 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

International Electrotechnical Commission, 04/12/2002

Publisher: IEC

File Format: PDF

$11.00$23.00


Published:12/04/2002

Pages:15

File Size:1 file , 510 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

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