IEC 60749-41 Ed. 1.0 b:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

International Electrotechnical Commission, 07/22/2020

Publisher: IEC

File Format: PDF

$95.00$190.00

Description

Published:22/07/2020

Pages:44

File Size:1 file , 1.5 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

More IEC standard pdf

IEC 60794-1-21 Ed. 1.1 b:2020

Optical fibre cables - Part 1-21: Generic specification - Basic optical cable test procedures - Mechanical tests methods CONSOLIDATED EDITION

$367.00 $734.00

IEC 61010-2-040 Ed. 3.0 b:2020

Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 2-040: Particular requirements for sterilizers and washer-disinfectors used to treat medical materials

$139.00 $278.00

IEC 62938 Ed. 1.0 b:2020

Photovoltaic (PV) modules - Non-uniform snow load testing

$72.00 $145.00

IEC 60050-485 Ed. 1.0 b:2020

International Electrotechnical Vocabulary (IEV) - Part 485: Fuel cell technologies

$208.00 $417.00