IEC 60749-41 Ed. 1.0 b:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

International Electrotechnical Commission, 07/22/2020

Publisher: IEC

File Format: PDF

$95.00$190.00

Description

Published:22/07/2020

Pages:44

File Size:1 file , 1.5 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

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