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IEC 60749-5 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

International Electrotechnical Commission, 01/17/2003

Publisher: IEC

File Format: PDF

$11.00$23.00


Published:17/01/2003

Pages:13

File Size:1 file , 270 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.

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