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IEC 60749-6 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

International Electrotechnical Commission, 04/12/2002

Publisher: IEC

File Format: PDF

$6.00$12.00


Published:12/04/2002

Pages:7

File Size:1 file , 380 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

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