• Your shopping cart is empty!

PDF Preview

IEC 60749-8 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

International Electrotechnical Commission, 08/30/2002

Publisher: IEC

File Format: PDF

$47.00$95.00


Published:30/08/2002

Pages:31

File Size:1 file , 560 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

More IEC standard pdf

IEC 62054-11 Ed. 1.0 en:2004

IEC 62054-11 Ed. 1.0 en:2004

Electricity metering (a.c.) - Tariff and load control - Part 11: Particular requirements for electronic ripple control receivers

$95.00 $190.00

IEC 60269-3-1 Ed. 2.0 b:2004

IEC 60269-3-1 Ed. 2.0 b:2004

Low-voltage fuses - Part 3-1: Supplementary requirements for fuses for use by unskilled persons (fuses mainly for household and similar applications) - Sections I to IV: Examples of types of standardized fuses

$112.00 $225.00

IEC 60335-2-36 Ed. 5.1 b:2004

IEC 60335-2-36 Ed. 5.1 b:2004

Household and similar electrical appliances - Safety - Part 2-36: Particular requirements for commercial electric cooking ranges, ovens, hobs and hob elements CONSOLIDATED EDITION

$132.00 $264.00

IEC 61000-4-4 Ed. 2.0 b:2004

IEC 61000-4-4 Ed. 2.0 b:2004

Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test

$85.00 $171.00