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IEC 60749-8 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

International Electrotechnical Commission, 08/30/2002

Publisher: IEC

File Format: PDF

$47.00$95.00


Published:30/08/2002

Pages:31

File Size:1 file , 560 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

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