• Your shopping cart is empty!

PDF Preview

IEC 60749-9 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking

International Electrotechnical Commission, 04/12/2002

Publisher: IEC

File Format: PDF

$11.00$23.00


Published:12/04/2002

Pages:9

File Size:1 file , 410 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all package types. The test should be considered non-destructive.

More IEC standard pdf

IEC 60706-3 Ed. 1.0 b:1987

IEC 60706-3 Ed. 1.0 b:1987

Guide on maintainability of equipment. Part 3 - Sections Six and Seven. Verification and collection, analysis and presentation of data

$41.00 $83.00

IEC 60721-2-3 Ed. 1.0 b:1987

IEC 60721-2-3 Ed. 1.0 b:1987

Classification of environmental conditions - Part 2: Environmental conditions appearing in nature. Air pressure

$13.00 $27.00

IEC 60335-2-48 Amd.1 Ed. 4.0 b:2008

IEC 60335-2-48 Amd.1 Ed. 4.0 b:2008

Amendment 1 - Household and similar electrical appliances - Safety - Part 2-48: Particular requirements for commercial electric grillers and toasters

$6.00 $13.00

IEC 60546-2 Ed. 1.0 b:1987

IEC 60546-2 Ed. 1.0 b:1987

Controllers with analogue signals for use in industrial-process control systems. Part 2: Guidance for inspection and routine testing

$18.00 $36.00