IEC 60759 Ed. 1.0 b:1983

Standard test procedures for semiconductor X-ray energy spectrometers

International Electrotechnical Commission, 01/01/1983

Publisher: IEC

File Format: PDF

$164.00$329.00

Description

Published:01/01/1983

Pages:97

File Size:1 file , 4.5 MB

Note:This product is unavailable in Ukraine, Russia, Belarus

Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.

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