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International Electrotechnical Commission, 12/12/2012
Publisher: IEC
File Format: PDF
$23.00$47.00
Published:12/12/2012
Pages:17
File Size:1 file , 230 KB
Note:This product is unavailable in Ukraine, Russia, Belarus
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
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Environmental testing - Part 2: Tests. Test Sa: Simulated solar radiation at ground level
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Weibull analysis
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Medical electrical equipment - Exposure index of digital X-ray imaging systems - Part 1: Definitions and requirements for general radiography