IEC 61164 Ed. 2.0 en:2004

Reliability growth - Statistical test and estimation methods

International Electrotechnical Commission, 03/24/2004

Publisher: IEC

File Format: PDF

$121.00$243.00

Description

Published:24/03/2004

Pages:55

File Size:1 file , 780 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme. These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.

More IEC standard pdf

IEC 61535 Ed. 3.0 b:2023

Installation couplers intended for permanent connection in fixed installations

$183.00 $367.00

IEC 61158-4-21 Ed. 3.0 en:2023

Industrial communication networks - Fieldbus specifications - Part 4-21: Data-link layer protocol specification - Type 21 elements

$227.00 $455.00

IEC 60747-5-16 Ed. 1.0 en:2023

Semiconductor devices – Part 5-16: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy

$72.00 $145.00

IEC 61784-2-6 Ed. 1.0 b:2023

Industrial networks – Profiles – Part 2-6: Additional real-time fieldbus profiles based on ISO/IEC/IEEE 8802-3 – CPF 6

$47.00 $95.00