• IEC 61300-3-16 Ed. 2.0 b:2003

IEC 61300-3-16 Ed. 2.0 b:2003

Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-16: Examinations and measurements - Endface radius of spherically polished ferrules

International Electrotechnical Commission, 01/15/2003

Publisher: IEC

File Format: PDF

$36.00$73.00


Published:15/01/2003

Pages:27

File Size:1 file , 770 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Describes a procedure to measure the endface radius of a spherically polished ferrule and angled ferrule or an angled spherically polished ferrule.

More IEC standard pdf

IEC 60384-20 Ed. 3.0 b:2015

IEC 60384-20 Ed. 3.0 b:2015

Fixed capacitors for use in electronic equipment - Part 20: Sectional specification - Fixed metallized polyphenylene sulfide film dielectric surface mount d.c. capacitors

$117.00 $234.00

IEC 62951-3 Ed. 1.0 en:2018

IEC 62951-3 Ed. 1.0 en:2018

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

$95.00 $190.00

IEC 63068-2 Ed. 1.0 en:2019

IEC 63068-2 Ed. 1.0 en:2019

Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection

$95.00 $190.00

IEC 60836 Ed. 3.0 b:2015

IEC 60836 Ed. 3.0 b:2015

Specifications for unused silicone insulating liquids for electrotechnical purposes

$25.00 $51.00