• IEC 61340-3-2 Ed. 1.0 b:2002

IEC 61340-3-2 Ed. 1.0 b:2002

Electrostatics - Part 3-2: Methods for simulation of electrostatic effects - Machine model (MM) - Component testing

International Electrotechnical Commission, 03/25/2002

Publisher: IEC

File Format: PDF

$18.00$37.00


Published:25/03/2002

Pages:17

File Size:1 file , 430 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Describes the discharge current waveforms used to define the MM and the basic equipment requirements used to develop these waveforms. Test parameters are defined for testing and classifying the electrostatic discharge (ESD) sensitivity of non-powered devices to the MM. The purpose of this standard is to establish a test model that will replicate MM failures and will define the MM transient current discharge waveform and all necessary test parameters to ensure reliable, reproducible test results. Reproducible data will allow accurate comparisons of MM ESD sensitivity levels.

More IEC standard pdf

IEC 62439-4 Amd.1 Ed. 1.0 b:2012

IEC 62439-4 Amd.1 Ed. 1.0 b:2012

Amendment 1 - Industrial communication networks - High availability automation networks - Part 4: Cross-network Redundancy Protocol (CRP)

$6.00 $13.00

IEC 60191-2Z Ed. 1.0 en:2000

IEC 60191-2Z Ed. 1.0 en:2000

Twenty-fourth supplement to Publication 60191-2 (1966) MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - Part 2: Dimensions

$25.00 $50.00

IEC 60191-6-3 Ed. 1.0 b:2000

IEC 60191-6-3 Ed. 1.0 b:2000

Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)

$72.00 $145.00

IEC 60216-4-1 Ed. 4.0 en:2006

IEC 60216-4-1 Ed. 4.0 en:2006

Electrical insulating materials - Thermal endurance properties - Part 4-1: Ageing ovens - Single-chamber ovens

$72.00 $145.00