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International Electrotechnical Commission, 12/14/2006
Publisher: IEC
File Format: PDF
$115.00$230.00
Published:14/12/2006
Pages:32
File Size:1 file , 380 KB
Note:This product is unavailable in Ukraine, Russia, Belarus
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
$95.00 $190.00
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
Specifications for unused silicone insulating liquids for electrotechnical purposes
$25.00 $51.00
Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects