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International Electrotechnical Commission, 01/20/2005
Publisher: IEC
File Format: PDF
$110.00$221.69
Published:20/01/2005
Pages:870
Semiconductor devices - Discrete devices - Part 3: Signal (including switching) and regulator diodes
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Common test methods for insulating and sheathing materials of electric cables - Part 1: Methods for general application - Section Two: Thermal ageing methods
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Common test methods for insulating and sheathing materials of electric cables - Part 1: Methods for general application - Section Four: Tests at low temperature
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Analysis techniques for system reliability - Procedure for failure mode and effects analysis (FMEA)
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