IEC 61580-9 Ed. 1.0 b:1996

Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces

International Electrotechnical Commission, 07/03/1996

Publisher: IEC

File Format: PDF

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Description

Published:03/07/1996

Pages:15

File Size:1 file , 530 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.

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