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  • IEC 61649 Ed. 1.0 b:1997

IEC 61649 Ed. 1.0 b:1997

Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

International Electrotechnical Commission, 05/16/1997

Publisher: IEC

File Format: PDF

$38.00$77.00


Published:16/05/1997

Pages:31

File Size:1 file , 150 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. Applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.

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