Your shopping cart is empty!
PDF Preview
International Electrotechnical Commission, 04/01/2021
Publisher: IEC
File Format: PDF
$164.00$329.00
Published:01/04/2021
Pages:88
File Size:1 file , 3.9 MB
Note:This product is unavailable in Ukraine, Russia, Belarus
This part of IEC 61788 specifies the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is limited to the measurement without DC magnetic fields.
This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows.
- Jcd: from 200 A/m to 32 kA/m (based on results, not limitation). - Measurement resolution: 100 A/m (based on results, not limitation).
Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
$164.00 $329.00
Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 112: Quantities and units
$6.00 $13.00
Amendment 1 - Corrigendum 1 - Rotating electrical machines - Part 18-41: Partial discharge free electrical insulation systems (Type I) used in electrical rotating machines fed from voltage converters - Qualification and quality control tests
$100.00 $200.17
Fibre optic active components and devices - Package and interface standards - Part 21: Design guide of electrical interface of PIC packages using silicon fine-pitch ball grid array (S-FBGA) and silicon fine-pitch land grid array (S-FLGA)
$47.00 $95.00