IEC 61788-3 Ed. 1.0 en:2000

Superconductivity - Part 3: Critical current measurement - DC critical current of Ag-sheathed Bi-2212 and Bi-2223 oxide superconductors

International Electrotechnical Commission, 12/14/2000

Publisher: IEC

File Format: PDF

$37.00$74.00

Description

Published:14/12/2000

Pages:21

File Size:1 file , 170 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Covers a test method for the determination of the d.c. critical current of short and straight Ag- or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors that have a monolithic structure and a shape of round wire or flat or square tape containing mono- or multicores of oxides.

More IEC standard pdf

IEC 61158-4-11 Ed. 1.0 en:2007

Industrial communication networks - Fieldbus specifications - Part 4-11: Data-link layer protocol specification - Type 11 elements

$125.00 $250.00

IEC 61189-3 Ed. 2.0 b:2007

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 3: Test methods for interconnection structures (printed boards)

$227.00 $455.00

IEC 61189-3 Ed. 2.0 en:2007

Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 3: Test methods for interconnection structures (printed boards)

$158.00 $317.00

IEC 62047-21 Ed. 1.0 b:2014

Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials

$47.00 $95.00