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International Electrotechnical Commission, 09/28/2015
Publisher: IEC
File Format: PDF
$6.00$13.00
Published:28/09/2015
Pages:4
File Size:1 file , 170 KB
Note:This product is unavailable in Ukraine, Russia, Belarus
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Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
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Good refurbishment practices for medical imaging equipment
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