IEC 62047-3 Ed. 1.0 b:2006

Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing

International Electrotechnical Commission, 08/15/2006

Publisher: IEC

File Format: PDF

$12.00$25.00


Published:15/08/2006

Pages:15

File Size:1 file , 350 KB

Note:This product is unavailable in Ukraine, Russia, Belarus

Specifies a standard test piece, which is used to guarantee the propriety and accuracy of a tensile testing system for thin film materials with length and width under 1 mm and thickness under 10 m, which are main structural materials for microelectromechanical systems (MEMS), micromachines and similar devices. It is based on such a concept that a tensile testing system can be guaranteed in propriety and accuracy, when the measured tensile strengths of the standard test pieces, whose tensile strength is pre-determined, are within the designated range. It also specifies the test pieces to minimize characteristics deviation among the pieces.

More IEC standard pdf

IEC 61262-4 Ed. 1.0 b:1994

IEC 61262-4 Ed. 1.0 b:1994

Medical electrical equipment - Characteristics of electro-optical X-ray image intensifiers - Part 4: Determination of the image distortion

$25.00 $51.00

IEC 60455-2 Ed. 2.0 b:1998

IEC 60455-2 Ed. 2.0 b:1998

Resin based reactive compounds used for electrical insulation - Part 2: Methods of test

$91.00 $182.00

IEC 60835-2-7 Ed. 1.0 b:1994

IEC 60835-2-7 Ed. 1.0 b:1994

Methods of measurement for equipment used in digital microwave radio transmission systems - Part 2: Measurements on terrestrial radio-relay systems - Section 7: Diversity switching and combining equipment

$117.00 $234.00

IEC 61076-2 Ed. 1.0 b:1998

IEC 61076-2 Ed. 1.0 b:1998

Connectors for use in d.c., low-frequency analogue and digital high speed data applications - Part 2: Circular connectors with assessed quality - Sectional specification

$66.00 $132.00